Surface-defect segmentation in latent space
Reduced computation by segmenting defects in the decoder latent space, with improved few-shot accuracy over the evaluated baselines.
IEEE Transactions on Instrumentation and Measurement, 2024 ↗Computer vision · Railway infrastructure
Assistant ResearcherChina Academy of Railway Sciences
I study how to detect small defects and segment their boundaries with limited data and computing resources. My work spans railway catenary and rail-surface inspection, from low-power screening to detailed recognition.
Latest publication · IEEE TITS, 2026
Low-power screening triggers detailed segmentation when a potential defect is found. S2R combines spiking and convolutional neural networks, with contrastive learning and hard-sample mining to distinguish defects from background interference.
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Selected research results
Reduced computation by segmenting defects in the decoder latent space, with improved few-shot accuracy over the evaluated baselines.
IEEE Transactions on Instrumentation and Measurement, 2024 ↗A rendering-inspired architecture that moves from a coarse prediction to fine defect boundaries while keeping the model lightweight.
IEEE Transactions on Instrumentation and Measurement, 2023 ↗Background
I received my Ph.D. in Computer Science from Southwest Jiaotong University in June 2026. During my doctorate, I completed joint research at Nanyang Technological University (August 2024–December 2025) and the University of Birmingham (January–August 2024).
I also hold an M.Eng. in Software Engineering and a B.Eng. in Internet of Things Engineering. My other research includes road-crack recognition, multi-vehicle tracking and contour-guided restoration of Thangka artworks and Tibetan murals.
Education, projects and honors ↗Assistant Researcher · Railway visual inspection
AI Research Intern · Participated in data analysis for a Mastercard prediction project
Test Development Intern · Automated JSAPI testing for WeChat Work
Research papers
IEEE Transactions on Intelligent Transportation Systems
IEEE Transactions on Instrumentation and Measurement · vol. 73, pp. 1–11, Art. no. 5029111
IEEE Transactions on Instrumentation and Measurement · vol. 72, pp. 1–8, Art. no. 2512808
IEEE Sensors Journal · vol. 23, no. 11, pp. 11815–11824
Contact
For research collaboration and professional enquiries.